The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2026
Filed:
Dec. 07, 2023
Applicant:
Citex Holding Gmbh, Melle, DE;
Inventors:
Arno Neumeister, Porta Westfalica, DE;
Christoph Herrmann, Karlsbad, DE;
Assignee:
CiTEX Holding GmbH, Melle, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/18 (2018.01); G01N 23/083 (2018.01);
U.S. Cl.
CPC ...
G01N 23/18 (2013.01); G01N 23/083 (2013.01); G01N 2223/1016 (2013.01); G01N 2223/3032 (2013.01); G01N 2223/32 (2013.01); G01N 2223/401 (2013.01); G01N 2223/413 (2013.01); G01N 2223/628 (2013.01); G01N 2223/646 (2013.01); G01N 2223/652 (2013.01);
Abstract
The present disclosure relates to an X-ray measuring method and an X-ray measuring device for measuring a strand.
Neumeister, Arno. (2026). X-ray measuring method and x-ray measuring device for measuring a strand (U.S. Patent No. 12723995). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12723995
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile