The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2026
Filed:
Jan. 21, 2021
Hamamatsu Photonics K.k., Hamamatsu, JP;
Fusanori Kondo, Hamamatsu, JP;
Naoki Iwata, Hamamatsu, JP;
Tomokazu Matsumura, Hamamatsu, JP;
Teruo Takeshita, Hamamatsu, JP;
HAMAMATSU PHOTONICS K.K., Hamamatsu, JP;
Abstract
In an optical measurement device, in a first process, a reference member is irradiated with excitation light, light for a calibration process including scattered light associated with the excitation light from a reference member is detected as detection light, a calibration signal corresponding to the light for the calibration process is designated as a detection signal, and a calibration process for removing a signal component corresponding to the scattered light from the detection signal in a second process is performed. Also, in the optical measurement device, in the second process, a sample is irradiated with the excitation light, measurement target light including fluorescence generated from the sample and light scattered from the sample irradiated with the excitation light is detected as detection light, and a signal component corresponding to the scattered light from a measurement signal.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile