The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2026
Filed:
Nov. 21, 2023
Taikisha Ltd., Tokyo, JP;
Subaru Corporation, Tokyo, JP;
Tadashi Sumii, Tokyo, JP;
Hidetsugu Nosaka, Tokyo, JP;
Tatsuya Hirose, Tokyo, JP;
Yusuke Tsurui, Tokyo, JP;
TAIKISHA LTD., Tokyo, JP;
SUBARU CORPORATION, Tokyo, JP;
Abstract
Provided are an inspection device and an inspection method capable of controlling the positional relationship between a device and a measurement object to achieve an attitude enabling an appropriate detection of the surface conditions. The inspection device includes: a detector including a transmitter configured to transmit a transmission wave to a measurement object and a receiver configured to receive a return wave generated as a result of the transmission wave hitting the measurement object; and at least one sucker configured to suck the measurement object to regulate respective positions of the measurement object and the detector relative to each other.