The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2026

Filed:

Jul. 14, 2024
Applicant:

Nanjing University of Aeronautics and Astronautics, Nanjing, CN;

Inventors:

Qinan Han, Nanjing, CN;

Jianwen Fang, Nanjing, CN;

Haitao Cui, Nanjing, CN;

Yue Su, Nanjing, CN;

Hongjian Zhang, Nanjing, CN;

Huiji Shi, Nanjing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/00 (2006.01); G01N 1/44 (2006.01); G01N 3/06 (2006.01); G01N 3/10 (2006.01); G01N 3/18 (2006.01); G01N 3/32 (2006.01); G01N 3/56 (2006.01);
U.S. Cl.
CPC ...
G01N 3/06 (2013.01); G01N 3/10 (2013.01); G01N 2203/0073 (2013.01); G01N 2203/0226 (2013.01);
Abstract

The present disclosure discloses an extremely high-temperature in-situ fretting fatigue experimental device for a mortise-tenon joint. The device includes: a loading member configured to support a tenon specimen and a mortise specimen, and apply a fatigue load; a heating member to heat the tenon specimen and the mortise specimen; a thermal insulation sleeve wrapping the heating member; a thermal insulation shield with an observation hole; and a control member configured to control operation of the fatigue loading. Various measures including the using of heat-resistant materials for the gasket, thermal insulation shield and sleeve, reducing and shielding thermal electrons, and decreasing a temperature in non-critical areas are adopted to improve high-temperature imaging quality of an in-situ Scanning Electron Microscope (in-situ SEM) and enhance an upper limit of an in-situ SEM experimental temperature.


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