The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2026

Filed:

Jan. 11, 2022
Applicant:

Phc Corporation, Ehime, JP;

Inventors:

Wei Hu, Shanghai, CN;

Derong Chen, Shanghai, CN;

Chao Li, Shanghai, CN;

Thomas F. Hamilton, Surrey, GB;

Youichi Tanizaki, Saijo City, JP;

Yue Jiang, Shanghai, CN;

James M. Coleman, Shanghai, CN;

Yulun Chen, Taipei City, TW;

Assignee:

PHC Corporation, Ehime, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B01L 3/00 (2006.01);
U.S. Cl.
CPC ...
B01L 3/5023 (2013.01); B01L 2200/025 (2013.01); B01L 2200/04 (2013.01); B01L 2200/082 (2013.01); B01L 2200/10 (2013.01); B01L 2200/141 (2013.01); B01L 2300/027 (2013.01); B01L 2300/0609 (2013.01); B01L 2300/0663 (2013.01); B01L 2300/0825 (2013.01); B01L 2400/0478 (2013.01);
Abstract

An analyte meter having a test strip ejector. The analyte meter includes a housing body including a front side, a back side, a first side, a second side, an end, and a test strip port at the end configured to receive a test strip; and a strip ejector configured to eject the test strip from the test strip port. The test strip ejector includes a slide member slidable relative to the housing body, an engagement member coupled to the slide member and configured to be contacted by a user, the engagement member located on the back side of the housing body opposite then display screen, and a push member coupled to the slide member and positioned to be engageable with the end of the test strip. Test strip ejectors and methods of ejecting test strips are provided, as are numerous other aspects.


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