The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2026
Filed:
Dec. 07, 2022
Meditulip Co., Ltd., Cheongju-si, KR;
Min Woong Kang, Daejeon, KR;
Ji Eun Oh, Daejeon, KR;
MEDITULIP CO., LTD., Cheongju-si, KR;
Abstract
An embodiment provides a computed tomography image analysis device and an analysis method using same, the computed tomography image analysis device comprising: a parameter calculation unit that, on the basis of the volume of a lesion in a computed tomography image and a histogram showing the distribution of Hounsfield values, calculates a reference value for the Hounsfield values; an excess rate calculation unit that calculates an excess rate that corresponds to the ratio of a region with a Hounsfield value exceeding the reference value to the total volume of the lesion in the computed tomography image; and a prediction value calculation unit that, on the basis of whether or not the excess rate exceeds a cutoff value on a reference ROC curve for the reference value, calculates a prediction value regarding whether the lesion is invasive or not.
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