The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2026

Filed:

Sep. 27, 2023
Applicant:

Alcon Inc., Fribourg, CH;

Inventor:

Paul R. Hallen, Colleyville, TX (US);

Assignee:

Alcon Inc., Fribourg, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01); A61B 3/00 (2006.01); A61B 3/103 (2006.01); G01S 17/894 (2020.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
A61B 3/1015 (2013.01); A61B 3/0025 (2013.01); A61B 3/102 (2013.01); A61B 3/103 (2013.01); G01S 17/894 (2020.01); G06T 7/0016 (2013.01); A61B 2560/02 (2013.01); A61B 2560/04 (2013.01); G06T 2207/30041 (2013.01);
Abstract

Particular embodiments include, by a computing device, receiving one or more wavefront elevation maps for a patient's eye and identifying one or more attributes of the one or more wavefront elevation maps corresponding to vitreous floaters. The one or more attributes may include localized spatial variation of the one or more wavefront elevation maps; temporal variation among a plurality of wavefront elevation maps; and depth information indicating scattering of light from within the vitreous of the patient's eye. A machine learning model may be trained and utilized to characterize vitreous floaters based on the one or more wavefront elevation maps and other patient data. The wavefront elevation maps may be measured using an aberrometer. The aberrometer may be integrated with a LIDAR system to estimate depth of scattered light. A common laser light source may be used for both the aberrometer and the LIDAR system.


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