The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2026

Filed:

Jan. 17, 2023
Applicant:

Infineon Technologies Ag, Neubiberg, DE;

Inventors:

Ravi Keshav Joshi, Klagenfurt am Wörthersee, AT;

Romain Esteve, Munich, DE;

Saurabh Roy, Villach, AT;

Bernhard Goller, Villach, AT;

Werner Schustereder, Villach, AT;

Kristijan Luka Mletschnig, Klagenfurt, AT;

Assignee:

Infineon Technologies AG, Neubiberg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10D 64/62 (2025.01); H10D 64/01 (2025.01); H10D 64/23 (2025.01); H10P 95/00 (2026.01); H10W 20/43 (2026.01);
U.S. Cl.
CPC ...
H10D 64/62 (2025.01); H10D 64/01 (2025.01); H10D 64/252 (2025.01); H10P 95/00 (2026.01); H10W 20/43 (2026.01);
Abstract

A semiconductor device includes a semiconductor substrate and a metal nitride layer above the semiconductor substrate. The metal nitride layer forms at least one interface region with the semiconductor substrate. The at least one interface region includes a first portion of the semiconductor substrate, a first portion of the metal nitride layer, and an interface between the first portion of the semiconductor substrate and the first portion of the metal nitride layer. A concentration of nitrogen content at the first portion of the metal nitride layer is higher than a concentration of nitrogen content at a second portion, of the metal nitride layer, outside the interface region. A distribution of nitrogen content throughout the metal nitride layer may have a maximum concentration at the first portion of the metal nitride layer. Alternatively and/or additionally, a method for producing such a semiconductor device is provided herein.


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