The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2026

Filed:

Sep. 27, 2022
Applicant:

Huawei Technologies Co., Ltd., Shenzhen, CN;

Inventors:

Xuesong Wang, Beijing, CN;

Li Zhang, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/10 (2009.01); H04W 24/08 (2009.01);
U.S. Cl.
CPC ...
H04W 24/10 (2013.01); H04W 24/08 (2013.01);
Abstract

A method for calculating a carrier specific scaling factor and a communication apparatus. In an EN-DC scenario, a terminal device receives configuration information, sent by a network device, of an NR frequency, that is of service frequency inter-system measurement, non-service frequency inter-system measurement, PSCC intra-frequency measurement, SCC intra-frequency measurement, and inter-frequency measurement, where the service frequency inter-system measurement, the non-service frequency inter-system measurement, the PSCC intra-frequency measurement, the SCC intra-frequency measurement, and the inter-frequency measurement unsupported by an MG, and the terminal device calculates a CSSF outside the MG of each to-be-measured NR frequency in measurement types. Therefore, a CSSF of NR inter-system measurement is included in calculation of the CSSF outside the MG, to avoid a case in which the terminal device is unable to report a measurement result of inter-system measurement within a measurement delay.


Find Patent Forward Citations

Wang, Xuesong. (2026). Method for calculating carrier specific scaling factor outside measurement gap and communication apparatus (U.S. Patent No. 12720346). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12720346

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