The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2026

Filed:

Sep. 30, 2021
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Koichi Nihei, Tokyo, JP;

Yoshifumi Onishi, Tokyo, JP;

Takanori Iwai, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 19/154 (2014.01); H04N 7/14 (2006.01); H04N 7/15 (2006.01); H04N 23/60 (2023.01); G06T 7/00 (2017.01); H04N 23/611 (2023.01);
U.S. Cl.
CPC ...
H04N 23/64 (2023.01); H04N 7/142 (2013.01); H04N 7/15 (2013.01); H04N 7/157 (2013.01); H04N 19/154 (2014.11); G06T 7/0012 (2013.01); G06T 2207/30168 (2013.01); G06T 2207/30201 (2013.01); H04N 23/611 (2023.01);
Abstract

An information processing system () includes: specifying means () for specifying, in accordance with an image-capture situation when an image is captured by an image-capturing apparatus () and an item of analysis with regard to the image distributed via a network, a first image quality of an area of a specific part in the image used for the analysis; and control means () for performing control for distributing the image by setting the image quality of the area of the specific part in the image to the first image quality.


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