The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2026

Filed:

Sep. 08, 2022
Applicant:

Yamaha Corporation, Hamamatsu, JP;

Inventors:

Akira Maezawa, Hamamatsu, JP;

Katsuhiro Iguchi, Hamamatsu, JP;

Assignee:

Yamaha Corporation, Hamamatsu, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G10H 1/00 (2006.01); G06N 5/04 (2023.01);
U.S. Cl.
CPC ...
G10H 1/0008 (2013.01); G06N 5/04 (2013.01); G10H 2210/091 (2013.01);
Abstract

A parameter inference method realized by a computer, includes obtaining target performance information indicating a performance of music using an electronic musical instrument; inferring assist information from the target performance information with use of a trained inference model generated through machine learning, the assist information being related to setting of a parameter of the electronic musical instrument that conforms to a tendency of the performance; and outputting the inferred assist information related to the setting of the parameter.


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Maezawa, Akira. (2026). Parameter inference method, parameter inference system, and parameter inference program (U.S. Patent No. 12718784). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12718784

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