The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2026
Filed:
Dec. 12, 2023
Sintokogio, Ltd., Nagoya, JP;
Kazuya Kojima, Nagoya, JP;
Norihiro Asano, Nagoya, JP;
SINTOKOGIO, LTD., Nagoya, JP;
Abstract
An abnormality determination device for an additive manufacturing apparatus for building a part having three-dimensional shape by repeatedly forming a membrane of raw material and forming a cured layer having two-dimensional shape, the membrane formed by a blade in a build area, the raw material including ceramic particles and photocurable resin, the cured layer formed by irradiating the membrane with light in the build area, the abnormality determination device includes a controller configured to perform abnormality determination based on an image captured by an image sensor, the controller is configured to acquire the image of the membrane captured by the image sensor, detect a linear abnormal portion appearing in the membrane as a line extending along a movement direction of the blade based on the acquired image of the membrane, and determine that layering fault has occurred in response to detection of the linear abnormal portion.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile