The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2026
Filed:
Dec. 15, 2023
Applicant:
Ta Instruments-waters Llc, New Castle, DE (US);
Inventor:
David L. Dingmann, Saint Paul, MN (US);
Assignee:
TA Instruments-Waters LLC, New Castle, DE (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/00 (2022.01); G01N 3/06 (2006.01); G06N 3/04 (2023.01); G06N 3/08 (2023.01); G06T 7/00 (2017.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06V 10/82 (2022.01); G01N 3/068 (2013.01); G06N 3/04 (2013.01); G06N 3/08 (2013.01); G06T 7/0004 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30164 (2013.01);
Abstract
Described are systems and methods for image recognition in test systems. A method for safe operation of a test system includes capturing image data representative of a test area of the test system with an imaging device, transmitting the image data representative of the test area from the imaging device to a processor running an image recognition application, detecting, by the image recognition application, a user presence within the test area, and adjusting the test system to a safe mode in response to the detecting the user presence within the test area.