The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2026

Filed:

Dec. 20, 2023
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Yuki Tanaka, Tokyo, JP;

Makoto Terao, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/774 (2022.01); G06V 10/74 (2022.01); G06V 10/77 (2022.01);
U.S. Cl.
CPC ...
G06V 10/7753 (2022.01); G06V 10/761 (2022.01); G06V 10/7715 (2022.01);
Abstract

In order to provide a technique for generating a high-inference accuracy learning model in machine learning in which unlabeled data is used, an information processing apparatus includes: an acquiring section configured to acquire labeled data and unlabeled data, the labeled data being image data to which a ground-truth label and attribute information are attached, the unlabeled data being image data to which an attribute information is attached; an inter-attribute distance calculating section configured to calculate a distance between the labeled data and the unlabeled data, the distance being determined by the attribute information; an extracting section configured to extract, from multiple pieces of unlabeled data each being the unlabeled data, unlabeled data smaller in the distance from the labeled data than another unlabeled data; and an updating section configured to update a model parameter with use of the labeled data and the unlabeled data extracted by the extracting section.


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