The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2026

Filed:

Sep. 29, 2023
Applicants:

Advanced Micro Devices, Inc., Santa Clara, CA (US);

Ati Technologies Ulc, Markham, CA;

Inventors:

Andrew Erin Kensler, Bellevue, WA (US);

Sean Keely, Austin, TX (US);

Michael John Livesley, Milton Keynes, GB;

David William John Pankratz, Markham, CA;

Assignees:

Advanced Micro Devices, Inc., Santa Clara, CA (US);

ATI Technologies ULC, Markham, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/06 (2011.01); G06T 17/00 (2006.01);
U.S. Cl.
CPC ...
G06T 15/06 (2013.01); G06T 17/005 (2013.01); G06T 2210/21 (2013.01);
Abstract

Devices and methods for rendering objects using ray tracing are provided which include during a build time: generating an accelerated hierarchy structure comprising data representing an approximate volume bounding a group of geometric shapes representing the objects in the scene and data representing the geometric shapes; and generating additional data used to transform rays, to be cast in the scene, from a high precision space to a low precision space; and during a render time occurring after the build time: performing ray intersection tests, using the additional data generated during the build time, for the rays in the scene; and rendering the scene based on the ray intersection tests. Because the additional data is generated prior to render time, the additional data can be used to perform the ray intersection testing more efficiently.


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