The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2026

Filed:

Jun. 28, 2023
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Yujie Lu, Vernon Hills, IL (US);

Liang Cai, Vernon Hills, IL (US);

Zhou Yu, Glenview, IL (US);

Jian Zhou, Buffalo Grove, IL (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 12/30 (2026.01); G06T 12/20 (2026.01);
U.S. Cl.
CPC ...
G06T 12/30 (2026.01); G06T 12/20 (2026.01); G06T 2210/41 (2013.01); G06T 2211/448 (2023.08);
Abstract

According to some embodiments, a method comprises obtaining a group of reconstructed-image data; converting the group of reconstructed-image data to a derivative of Radon space, thereby generating Radon-space data, wherein the Radon-space data have a radial sampling pattern in the derivative of Radon space; and generating resampled data by inputting the Radon-space data into a first trained machine-learning model for resampling Radon-space data, wherein the resampled data have a cone-beam-projection-geometry-shaped sampling pattern in the derivative of Radon space.


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