The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2026

Filed:

Apr. 18, 2024
Applicant:

Liberty Robotics Inc., Dexter, MI (US);

Inventors:

G. Neil Haven, Clearwater, ID (US);

Fansheng Meng, Ann Arbor, MI (US);

Assignee:

LIBERTY ROBOTICS INC., Dexter, MI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/60 (2017.01); G06T 5/60 (2024.01); G06T 5/70 (2024.01); G06T 7/521 (2017.01); G06T 7/593 (2017.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
G06T 7/60 (2013.01); G06T 5/60 (2024.01); G06T 5/70 (2024.01); G06T 7/521 (2017.01); G06T 7/593 (2017.01); G06T 7/75 (2017.01); G06T 2207/10028 (2013.01); G06T 2207/10048 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract

A method and system for creating a high-fidelity depiction of a scene including an object within the scene are provided. The method includes uniformly illuminating a target surface of the object with light to obtain reflected, backscattered illumination. The method also includes sensing via a volumetric sensor, brightness of the surface due to a diffuse component of the backscattered illumination to obtain brightness information. Backscattered illumination from the target surface is inspected to obtain geometric measurements which include sensor noise. Rotationally and positionally invariant measured surface albedo including albedo noise of the object is computed based on the brightness and the geometric measurements. A machine-learning model such as a diffusion sensor model is applied to the geometric measurements and the measured surface albedo to remove the sensor noise and the albedo noise, respectively, to obtain a prediction of actual geometry and actual albedo, respectively, of the object.


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