The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2026
Filed:
Dec. 20, 2023
Leica Biosystems Imaging, Inc., Vista, CA (US);
Allen Olson, San Diego, CA (US);
Chris Camaratta, San Diego, CA (US);
Leica Biosystems Imaging, Inc., Vista, CA (US);
Abstract
Methods and systems method for determining quality of an image after a system configuration change. A method includes receiving an indication of a configuration update of an imaging system, processing a test image using the image display system to generate updated test image pixel data for display on the imaging system, determining if the updated test image pixel data is different than the ground truth pixel data of the test image by more than a quality threshold, and in response to the updated test image pixel data being different than the ground truth pixel data of the test image by more than the quality threshold, generate in indicator that the configuration change adversely affected the image generation properties of the imaging system.