The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2026
Filed:
Jan. 17, 2022
Hitachi Solutions, Ltd., Tokyo, JP;
Hidekazu Ito, Tokyo, JP;
HITACHI SOLUTIONS, LTD., Tokyo, JP;
Abstract
The objective of the present disclosure is to provide a technique capable of efficiently monitoring quality of learning model without depending on input data. An AI quality monitoring system according to the present disclosure acquires an inferred result acquirable from a compared model inferring with respect to input data of same type as learning data learned by a learning model, and then compares the inferred result acquired from the compared model with correct answer data, thereby calculating an evaluation value representing how much the compared model is appropriate for determining quality of the learning model (refer to FIG.).
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile