The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2026

Filed:

Dec. 29, 2023
Applicant:

Mcafee, Llc, San Jose, CA (US);

Inventors:

German Lancioni, San Jose, CA (US);

Steve L. Grobman, Flower Mound, TX (US);

Jonathan B. King, Hillsboro, OR (US);

Assignee:

McAfee, LLC, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 18/24 (2023.01); G06F 18/232 (2023.01); G06F 21/56 (2013.01);
U.S. Cl.
CPC ...
G06F 18/24 (2023.01); G06F 18/232 (2023.01); G06F 21/56 (2013.01); G06F 2221/034 (2013.01);
Abstract

There is disclosed a computer-implemented system and method of classifying a target sample, wherein the target sample is a computer object having a feature vector, the method comprising: creating n sorted containers, comprising sorting a universe of samples based on feature vector distances from the samples to n vantage points, wherein n is a positive integer; storing the n sorted containers to a computer memory; bucketizing the n sorted containers; for the n vantage points, selecting, from the n bucketized sorted containers, n meta-buckets of that the target sample belongs to; creating an intersection container, comprising samples that appear in all n meta-buckets; selecting, as a target cluster, samples from the intersection container that have a feature vector distance from the target sample less than a threshold; and acting on the target cluster.


Find Patent Forward Citations

Loading…