The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2026

Filed:

Feb. 23, 2023
Applicant:

Fujitsu Limited, Kawasaki, JP;

Inventors:

Mehdi Bahrami, San Jose, CA (US);

Wei-Peng Chen, Fremont, CA (US);

Mukul Prasad, San Jose, CA (US);

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/18 (2006.01); G06F 40/20 (2020.01);
U.S. Cl.
CPC ...
G06F 17/18 (2013.01); G06F 40/20 (2020.01);
Abstract

In an embodiment, a statistical analysis tool is applied on a first set of datapoints related to a first variable associated with a dataset. Based on the application of the statistical analysis tool, statistical information related to the first variable is determined. A set of patterns associated with the first set of datapoints is determined, based on the determined statistical information. Thereafter, a first set of predefined templates associated with the determined set of patterns is determined. Further, a natural language model is applied on the retrieved first set of predefined templates and on the determined statistical information. A first textual explanation of the determined set of patterns is determined, based on the application of the natural language model on the retrieved first set of predefined templates and on the determined statistical information. Further, the determined first textual explanation is rendered on a display device.


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