The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2026

Filed:

Feb. 17, 2022
Applicant:

The Japan Steel Works, Ltd., Tokyo, JP;

Inventors:

Mikio Furokawa, Tokyo, JP;

Jun Suzuki, Tokyo, JP;

Takayuki Hirano, Tokyo, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/418 (2006.01); G06Q 50/04 (2012.01);
U.S. Cl.
CPC ...
G05B 19/4184 (2013.01); G06Q 50/04 (2013.01);
Abstract

An information processing method for detecting conditions of a plurality of manufacturing devices respectively used by a plurality of entities includes acquiring sensor value data obtained by detecting physical quantities related to the manufacturing devices; individually storing collected sensor value data in a plurality of databases; generating by machine learning a plurality of learning models based on the stored sensor value data; and calculating a condition of the manufacturing device of one of the entities by inputting sensor value data acquired from the manufacturing device of the one of the entities to the one or more of the learning models selected by the one of the entities.


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