The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2026
Filed:
Aug. 22, 2022
Universiteit Gent, Ghent, BE;
Kristiaan Neyts, Ghent, BE;
UNIVERSITEIT GENT, Ghent, BE;
Abstract
A method is provided for deriving a surface profile of a free-form master lens for patterning one or two photo-alignment layers of a planar optical component. The method includes obtaining a desired optical function of the planar optical component; and obtaining an actual optical function of the planar optical component, the actual optical function being described as recorded using a free-form test lens with a surface profile configured to provide the desired optical function. The method includes estimating a deviation between the desired optical function and the actual optical function; and correcting the surface profile of the free-form test lens using the estimated deviation, thereby deriving a surface profile for the free-form master lens.