The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2026
Filed:
Sep. 08, 2025
Pramana, Inc., Cambridge, MA (US);
Raghubansh Bahadur Gupta, Bangalore, IN;
Rohan Prateek, Uttar Pradesh, IN;
Sanku Bhanu Prakash, Bangalore, IN;
Sai Pranav Varada Raghunath, Bengaluru, IN;
Prasanth Perugupalli, Cary, NC (US);
Pramana, Inc., Cambridge, MA (US);
Abstract
An apparatus and method for inline detection and modification of suboptimal scan views of a plurality of consecutive images. The apparatus includes at least a processor and a memory communicatively connected to the at least a processor. The memory instructs the processor to receive the plurality of consecutive images from at least an imaging device, wherein each consecutive image of the plurality of consecutive images is associated with at least an image metric, detect a first consecutive image and a second consecutive image that are out of specification, wherein the second consecutive image is suboptimal, modify the one or more metrics as a function of the probed focal plane, and initiate a rescanning operation of the second consecutive image as a function of the probed focal plane.