The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2026

Filed:

Dec. 30, 2022
Applicant:

Waymo Llc, Mountain View, CA (US);

Inventors:

Ganesh Balachandran, Mountain View, CA (US);

Alexander Yukio Piggott, Mountain View, CA (US);

Assignee:

Waymo LLC, Mountain View, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 17/36 (2006.01); G01S 7/4912 (2020.01); G01S 7/493 (2006.01); G01S 17/58 (2006.01);
U.S. Cl.
CPC ...
G01S 17/36 (2013.01); G01S 7/4917 (2013.01); G01S 7/493 (2013.01); G01S 17/58 (2013.01);
Abstract

The subject matter of this specification can be implemented in, among other things, systems and methods of optical sensing that use destructive interference to suppress retro-reflected light during generation of sensing beams. Described, among other things, is a system that outputs a modulated transmitted (TX) beam and collects a received (RX) beam having one or more beams reflected from outside object(s). The system obtains, using the RX beam, a first phase information (PI) that includes a first feature and a second feature. The system obtains, using a copy of the modulated TX beam, a second PI, and reduces, using the second PI, the first feature of the first PI. The system then determines, using the second feature of the first PI, one or more characteristics of the outside object(s).


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