The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2026

Filed:

Sep. 17, 2021
Applicant:

Proceq SA, Schwerzenbach, CH;

Inventors:

Samuel Lehner, Zürich, CH;

Marcel Poser, Oberuzwil, CH;

Assignee:

PROCEQ SA, Schwerzenbach, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 13/88 (2006.01); G01S 7/35 (2006.01);
U.S. Cl.
CPC ...
G01S 13/885 (2013.01); G01S 7/356 (2021.05);
Abstract

The invention relates to a method and a device for probing a subsurface structure. The method comprises the steps of (a) sending a probe signal as an electromagnetic wave into the structure, (b) receiving an echo signal of the electromagnetic wave from the structure, and (c) processing the echo signal for deriving information about the structure. The step (c) of processing the echo signal comprises sampling the echo signal at a sampling frequency f. The probe signal comprises multiple discrete frequency components f, wherein at least two of the multiple frequency components fare located in different Nyquist zones. An n-th Nyquist zone covers a frequency range from (n−1)*Tf/2 to n*f/2 with fbeing the sampling frequency and n=1, 2 . . . . Further, k=1 . . . K and K is the number of frequency components fin the n-th Nyquist zone. The method and device facilitate an increase in data acquisition speed without losing information on any of the frequency components.


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