The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2026

Filed:

Jun. 04, 2021
Applicant:

Infineon Technologies Ag, Neubiberg, DE;

Inventors:

Markus Dielacher, Graz, AT;

Martin Flatscher, Graz, AT;

Hannes Plank, Graz, AT;

Armin Josef Schoenlieb, Seiersberg-Pirka, AT;

Assignee:

Infineon Technologies AG, Neubiberg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/497 (2006.01); G01S 7/481 (2006.01); G01S 7/4865 (2020.01); G01S 17/26 (2020.01); G01S 17/894 (2020.01);
U.S. Cl.
CPC ...
G01S 7/497 (2013.01); G01S 7/4813 (2013.01); G01S 7/4865 (2013.01); G01S 17/26 (2020.01); G01S 17/894 (2020.01);
Abstract

A method for characterizing a time-of-flight sensor and/or a cover covering the time-of-flight sensor is provided. The method includes performing at least one coded modulation measurement with the time-of-flight sensor for obtaining measurement data for light reflected from the cover back to the time-of-flight sensor. A measurement range of the time-of-flight sensor is configured to end shortly after the cover for the at least one coded modulation measurement. Further, the method includes determining characterization data based on the measurement data, wherein the characterization data indicate a quantity related to the time-of-flight sensor and/or the cover.


Find Patent Forward Citations

Loading…