The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2026

Filed:

Jul. 15, 2022
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Umesh Phuyal, San Diego, CA (US);

Le Liu, San Jose, CA (US);

Chiranjib Saha, San Diego, CA (US);

Wanshi Chen, San Diego, CA (US);

Masato Kitazoe, Tokyo, JP;

Bharat Shrestha, San Diego, CA (US);

Xiao Feng Wang, San Diego, CA (US);

Alberto Rico Alvarino, San Diego, CA (US);

Changhwan Park, San Diego, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 1/18 (2006.01); B64C 39/02 (2023.01); G08G 5/00 (2025.01); H04B 7/185 (2006.01); H04B 17/00 (2015.01); H04W 24/10 (2009.01);
U.S. Cl.
CPC ...
G01S 1/18 (2013.01); H04W 24/10 (2013.01);
Abstract

Methods, systems, and devices for wireless communication are described. An aerial UE may receive control signaling that indicates a plurality of beam measurement configurations that the aerial UE is to use for beam measurement and reporting associated with a plurality of beams. The aerial UE may monitor a set of beams of the plurality of beams in accordance with a subset of beam measurement configurations of the plurality of beam measurement configurations based on a current time, a current location of the aerial UE, or both, for example. The aerial UE may transmit a measurement report indicating one or more measurements of a subset of beams of the set of beams in accordance with the subset of beam measurement configurations. In some examples, the subset of beam measurement configurations may be associated with an altitude threshold, a three-dimensional zone, or a combination thereof.


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