The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2026
Filed:
May. 15, 2023
University of South Carolina, Columbia, SC (US);
Guangxing Niu, West Columbia, SC (US);
Bin Zhang, Irmo, SC (US);
UNIVERSITY OF SOUTH CAROLINA, Columbia, SC (US);
Abstract
Fault diagnosis and prognosis (FDP) is critical for ensuring system reliability and reducing operation and maintenance (O&M) costs. Lebesgue sampling based FDP (LS-FDP) is an event-based approach with the advantages of cost-efficiency, uncertainty management, and less computation. In previous works, LS-FDP approaches are mainly model-based. However, fault dynamic modeling is difficult and time consuming for some complex systems and this severely hinders the applications of LS-FDP. To address this problem, this present disclosure presents a data-driven based LS-FDP framework in which deep belief networks (DBN) and particle filter (PF) are integrated to achieve fault state estimation and remaining useful life (RUL) prediction. In the proposed approach, DBN learns the state evolution model and the Lebesgue time transition model, which are used as diagnostic and prognostic models in PF for FDP. The proposed approach has higher efficiency in terms of computation and better performance in terms of FDP accuracy and precision.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile