The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2026

Filed:

May. 31, 2024
Applicant:

Keysight Technologies, Inc., Santa Rosa, CA (US);

Inventor:

Kenichi Takano, Tokyo, JP;

Assignee:

KEYSIGHT TECHNOLOGIES, INC., Santa Rosa, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 13/02 (2006.01); G01R 31/08 (2020.01); G01R 31/11 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2841 (2013.01); G01R 13/0218 (2013.01); G01R 31/083 (2013.01); G01R 31/11 (2013.01);
Abstract

Methods, systems, and computer readable media for measuring voltage and current waveforms at devices under test. An example method includes outputting an electrical signal from a signal generator of a measurement instrument; measuring a first voltage at an input to an output resistance of the measurement instrument; measuring a second voltage at an output of the output resistance of the measurement instrument; and determining a test measurement voltage at a device under test (DUT) electrically connected to the measurement instrument using the first voltage, the second voltage, and a propagation delay of a transmission line electrically connecting the measurement instrument to the DUT.


Find Patent Forward Citations

Takano, Kenichi. (2026). Systems and methods for measuring waveforms at devices under test (U.S. Patent No. 12716937). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12716937

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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