The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2026

Filed:

Sep. 20, 2024
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventor:

Wolfgang Wendler, Groebenzell, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 13/02 (2006.01); G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2822 (2013.01); G01R 13/0245 (2013.01); G01R 31/001 (2013.01);
Abstract

A test and/or measurement device with noise figure functionality is provided, comprising a port for connecting the test and/or measurement device to a device under test, DUT, wherein a radio frequency, RF, signal is receivable and/or received from the DUT at said port, a measurement unit connected to said port, and configured to receive the RF signal from the port, to demodulate the RF signal into an in-phase-, I-, component and a quadrature-, Q-, component, and to digitize said I-component and said Q-component, a processing unit connected to said measurement unit, and configured to receive the correspondingly digitized I-component and the correspondingly digitized Q-component from the measurement unit, and to calculate phase noise based on the digitized I-component and the digitized Q-component, a display unit connected to said processing unit, and an input unit connected to said processing unit. The processing unit is configured to display the correspondingly calculated phase noise as a phase noise graph on the display unit. Furthermore, the processing unit is configured to receive an input information from the input unit, to display a marker element on the display unit based on the correspondingly received input information, and to calculate, especially to calculate and display, a respective noise figure of the DUT based on a corresponding actual position of the marker element on the display unit.


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Wendler, Wolfgang. (2026). Test and/or measurement device with noise figure functionality, and corresponding method (U.S. Patent No. 12716935). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12716935

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