The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2026

Filed:

Dec. 20, 2024
Applicant:

Endress+hauser Group Services Ag, Reinach, CH;

Inventors:

Tobias Meinert, Freiburg, DE;

Benjamin Scherer, Oberried, DE;

Ulrich Hoefer, Freiburg, DE;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/45 (2006.01); G01N 21/01 (2006.01); G01N 21/31 (2006.01); G01N 21/17 (2006.01);
U.S. Cl.
CPC ...
G01N 21/45 (2013.01); G01N 21/01 (2013.01); G01N 21/31 (2013.01); G01N 2021/0137 (2013.01); G01N 2021/1748 (2013.01); G01N 2021/3125 (2013.01); G01N 2021/451 (2013.01);
Abstract

A measuring arrangement for detecting trace gases in a sample gas, the measuring arrangement includes at least one narrow-band excitation light source; first and second chambers, wherein the excitation light is emitted into the chambers; a scrubber, wherein trace gases are removed from the sample gas as it passes between the first and second chambers; at least one narrow-band measurement light source arranged such that the measurement light hits the excitation light in the first chamber and second chambers; a detector unit which is in optical contact with the first and second chambers and detects the measurement light from the first and second chambers and converts it into a first and a second electrical signal; and a data processing unit which calculates the amount of trace gases in the sample gas from the first and second electrical signals. The present disclosure also discloses an alternative measuring arrangement and method.


Find Patent Forward Citations

Meinert, Tobias. (2026). Measuring arrangements and methods for the detection of trace gases in a sample gas (U.S. Patent No. 12716836). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12716836

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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