The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2026
Filed:
Oct. 30, 2023
Honeywell International Inc., Charlotte, NC (US);
Michael Leo Held, Stevens Point, WI (US);
Michael Forbes, North Vancouver, CA;
HONEYWELL INTERNATIONAL INC., Charlotte, NC (US);
Abstract
Profile alignment with cross-correlation is employed to determine the alignment between two measured profiles taken at different locations along a sheet of material. Aligning two profiles in sheet manufacturing is critical so that the coating weight on the sheet can be calculated. Coat weight profile is calculated by subtracting the weight of the sheet prior to coating from the measured total weight of the coated sheet after coating. When profiles are not aligned correctly for this subtraction, the coat weight profile will be inaccurate and corrective control actions for apparent deviations in coat weight may be applied to the wrong part of the sheet and may result in poor quality. Profile misalignments are monitored by repeatedly performing cross-correlation analysis as new measurement data becomes available. Offset is tracked over time and displayed. Automatic alerts are triggered when the offset deviates from zero and/or changes in value (within certain thresholds).