The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2026

Filed:

Jul. 25, 2022
Applicant:

Horiba, Ltd., Kyoto, JP;

Inventors:

Toshiyuki Michikita, Kyoto, JP;

Hiroshi Kawazoe, Kyoto, JP;

Kazuki Furukawa, Kyoto, JP;

Yoku Hirose, Kyoto, JP;

Kenji Shiomi, Kyoto, JP;

Assignee:

HORIBA, LTD., , JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/57 (2013.01); G01M 17/007 (2006.01);
U.S. Cl.
CPC ...
G01M 17/007 (2013.01); G06F 21/577 (2013.01);
Abstract

A test system that conducts a test of a test subject that is a vehicle or a part thereof that includes an electronic control device, comprises a drive test device for conducting a drive test of the test subject, an automatic driving robot that drives the test subject, and a signal control unit that is connected to the test subject by wire or wirelessly and that transmits, to the electronic control device, a test signal for evaluating the electronic control device.


Find Patent Forward Citations

Michikita, Toshiyuki. (2026). Test system, test method, and non-transitory computer readable medium for test system (U.S. Patent No. 12716816). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12716816

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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