The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2026
Filed:
Jan. 16, 2023
Method and device for determining geometric information relating to interfaces of an optical element
Applicant:
Fogale Nanotech, Nîmes, FR;
Inventors:
Sylvain Petitgrand, Caissargues, FR;
Eric Legros, Nîmes, FR;
Assignee:
FOGALE NANOTECH, Nîmes, FR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 11/02 (2006.01); G01B 11/06 (2006.01); G01B 11/27 (2006.01); G02B 27/62 (2006.01);
U.S. Cl.
CPC ...
G01M 11/0271 (2013.01); G01B 11/0608 (2013.01); G01B 11/27 (2013.01); G01M 11/0221 (2013.01); G02B 27/62 (2013.01);
Abstract
A method for determining an item of information of an interface of an optical element including several interfaces, the method being implemented by a device having at least one optical sensor and at least one light source in order to make a beam pass through at least one of the interfaces and be reflected by the interface to be measured, and in order to detect a signal of interferences between the reflected beam and a reference beam is disclosed. The method also includes