The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2026

Filed:

Jan. 17, 2024
Applicant:

Fca Us Llc, Auburn Hills, MI (US);

Inventor:

Hongyu Wang, Shanghai, CN;

Assignee:

FCA US LLC, Auburn Hills, MI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 3/02 (2006.01);
U.S. Cl.
CPC ...
G01M 3/025 (2013.01);
Abstract

A leak test fixture for a part such as a cylinder head or block has a plurality of side face sealing plates, a bottom face sealing plate and a top face sealing plate. The sealing plates collectively clamp and seal the part during testing of the part. A plurality of biasing mechanisms are provided on at least one of the sealing plates. The plurality of biasing mechanisms compress toward a face of the at least one sealing plate during clamping of the part. The plurality of biasing mechanisms rebound after testing of the part thereby help separating the part from the at least one sealing plate.


Find Patent Forward Citations

Wang, Hongyu. (2026). Spring system for leak test station (U.S. Patent No. 12716801). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12716801

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…