The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2026
Filed:
Nov. 22, 2023
Japan Display Inc., Tokyo, JP;
Toshinori Uehara, Tokyo, JP;
Fumihoru Nakano, Tokyo, JP;
Japan Display Inc., Tokyo, JP;
Abstract
Disclosed herein is a detection device including a sensor substrate including strain sensors arranged on a rectangular flexible substrate at fixed intervals in a longitudinal direction. A curvature radius between a pair of adjacent strain sensors is calculated on a value from a preceding strain sensor of the pair of adjacent sensors. When a start point node is defined as a position of a first strain sensor at one end of the strain sensors, a relative position of each of the strain sensors is determined by sequentially adding the relative positions. When the first and second strain sensors overlap, positions of the first and second strain sensors are considered identical on relative space. A position of each strain sensor is corrected based on a difference between a calculated position of the second strain sensor determined by sequentially adding the relative positions and actual position of the second strain sensor.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile