The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2026

Filed:

Nov. 29, 2022
Applicants:

Ntt, Inc., Tokyo, JP;

The University of Tokyo, Tokyo, JP;

Inventors:

Nobutomo Hanzawa, Musashino, JP;

Kazuhide Nakajima, Musashino, JP;

Takashi Matsui, Musashino, JP;

Hideaki Murayama, Tokyo, JP;

Ryota Wada, Tokyo, JP;

Makito Kobayashi, Tokyo, JP;

Assignees:

NTT, Inc., Tokyo, JP;

THE UNIVERSITY OF TOKYO, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/16 (2006.01);
U.S. Cl.
CPC ...
G01B 11/16 (2013.01);
Abstract

The present disclosure is a shape measurement system including: a multi-core optical fiber in which four or more cores are disposed in a part other than the center of a cross section; a strain distribution measurement device configured to measure a strain distribution of each of the cores in a longitudinal direction of the multi-core optical fiber; and an analysis device configured to calculate a shape of the multi-core optical fiber by using the strain distribution of the multi-core optical fiber.


Find Patent Forward Citations

Hanzawa, Nobutomo. (2026). Shape measurement system and shape measurement method (U.S. Patent No. 12716712). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12716712

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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