The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2026
Filed:
Jul. 07, 2023
Samsung Display Co., Ltd., Yongin-si, KR;
Gihyun Lee, Yongin-si, KR;
Jaisun Kyoung, Yongin-si, KR;
SAMSUNG DISPLAY CO., LTD., Gyeonggi-Do, KR;
Abstract
A method for analyzing a thin film includes: preparing a main sample and a plurality of comparative samples, each of which includes a first layer composed of a first material and a second layer composed of a second material and a third material, the first layer and the second layer being stacked, where each of the plurality of comparative samples has a different amount of the second material from the main sample; measuring optical constants of the main sample and the comparative samples; deriving a linear relation equation between each of the optical constants of the main sample and the comparative samples and the material amount of the second material of a corresponding one of the main sample and the comparative samples; and calculating a material composition ratio of the main sample based on the material amount of the second material of the main sample and the linear relation equation.