The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2026

Filed:

Jun. 20, 2023
Applicant:

Terumo Kabushiki Kaisha, Tokyo, JP;

Inventors:

Nozomu Yamazaki, Kanagawa, JP;

Masatsugu Igarashi, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12M 3/00 (2006.01); B01L 3/00 (2006.01); C12M 1/00 (2006.01); C12M 1/26 (2006.01); C12M 1/34 (2006.01);
U.S. Cl.
CPC ...
C12M 33/04 (2013.01); C12M 33/14 (2013.01); C12M 39/00 (2013.01); C12M 41/30 (2013.01); C12M 41/40 (2013.01);
Abstract

A sampling device includes a sampling channel, a detection unit and a sample introduction channel. A cell culturing device or the sample introduction channel includes an aseptic filter in a section before the sampling channel. A sampling method includes a sampling step for introducing the sample from the culturing device and detecting the sample by the detection unit and an adhering substance removal step for removing an adhering substance adhering to the aseptic filter by allowing a fluid to flow from the sampling channel to the sample introduction channel.


Find Patent Forward Citations

Yamazaki, Nozomu. (2026). Sampling method (U.S. Patent No. 12716045). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12716045

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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