The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2026

Filed:

Apr. 29, 2023
Applicant:

Shanghai United Imaging Healthcare Co., Ltd., Shanghai, CN;

Inventors:

Mengrong Han, Shanghai, CN;

Shuo Liu, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61N 5/10 (2006.01); G16H 20/40 (2018.01);
U.S. Cl.
CPC ...
A61N 5/1031 (2013.01); A61N 5/1039 (2013.01); G16H 20/40 (2018.01);
Abstract

The embodiments of the present disclosure provide methods and systems for determining radiation field information. The system may include: at least one storage medium including a set of instructions; and at least one processor in communication with the at least one storage medium, wherein when executing the set of instructions, the at least one processor is directed to cause the system to perform operations including: obtaining a candidate beam angle range for an object, the candidate beam angle range including at least one candidate beam angle; determining at least one candidate collimator angle or at least one candidate lock field parameter based on the candidate beam angle range; and determining target radiation field information based on the at least one candidate collimator angle or the at least one candidate lock field parameter.


Find Patent Forward Citations

Han, Mengrong. (2026). Methods and systems for determining radiation field information (U.S. Patent No. 12714878). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12714878

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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