The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2026

Filed:

Oct. 11, 2021
Applicant:

Topcon Corporation, Tokyo, JP;

Inventors:

Masashi Nakajima, Tokyo, JP;

Yasufumi Fukuma, Wako, JP;

Shu-Yun Yeh, Tokyo, JP;

Assignee:

TOPCON CORPORATION, Itabashi-ku, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01); A61B 3/103 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
A61B 3/1005 (2013.01); A61B 3/103 (2013.01); A61B 5/4842 (2013.01);
Abstract

Disclosed is a myopia progression analysis device including: an eye axial length acquisition section that acquires an eye axial length of an eye of a subject; a reference value acquisition section that acquires a numerical value related to a physical characteristic of the subject other than the eye axial length as a reference value; a relative eye axial length calculator that calculates a relative eye axial length through relativization of the eye axial length acquired by the eye axial length acquisition section using the reference value acquired by the reference value acquisition section; a population information acquisition section that acquires population information which is a set of information about relative eye axial lengths of a plurality of comparison targets to be compared with the subject; and a relative position information calculator.


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