The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 18, 2026

Filed:

May. 18, 2023
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Shuanshuan Wu, San Diego, CA (US);

Kapil Gulati, San Diego, CA (US);

Junyi Li, San Diego, CA (US);

Navid Abedini, San Diego, CA (US);

Anantharaman Balasubramanian, San Diego, CA (US);

Hui Guo, San Diego, CA (US);

Sourjya Dutta, San Diego, CA (US);

Assignee:

QUALCOMM INCORPORATED, SAN DIEGO, CA (US);

Primary Examiner:
Int. Cl.
CPC ...
U.S. Cl.
CPC ...
H04W 72/25 ; H04W 72/1215 ; H04W 72/541 ; H04B 7/0617 ; H04B 7/0665 ; H04L 5/001 ; H04L 5/0023 ; H04L 5/0048 ; H04L 5/0082 ; H04L 5/0091 ; H04L 5/14 ; H04L 5/1461 ; H04W 16/28 ;

Find Patent Forward Citations

Wu, Shuanshuan. (2026). Self-interference measurement for full duplex autonomous sidelink communication (U.S. Patent No. 12713446). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12713446

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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