The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 18, 2026

Filed:

Oct. 11, 2023
Applicant:

Leica Instruments (Singapore) Pte. Ltd., Singapore, SG;

Inventors:

Alvin Kok, Singapore, SG;

John Perng, St. Gallen, CH;

Jiarong Wu, Singapore, SG;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
U.S. Cl.
CPC ...
G16H 30/40 ; A61B 3/102 ; A61B 90/20 ; A61B 2090/364 ; A61B 2090/3735 ; A61B 2090/378 ; G06T 7/55 ; A61B 3/0025 ; A61B 3/0033 ; A61B 3/0058 ; A61B 5/0066 ; A61F 9/007 ; G06T 7/0014 ; G06T 11/00 ; G06T 2200/24 ; G06T 2207/10101 ; G06T 2207/10132 ; G06T 2207/20092 ; G06T 2207/30041 ; G06T 2210/41 ;

Find Patent Forward Citations

Kok, Alvin. (2026). Feature recognition and depth guidance using intraoperative oct (U.S. Patent No. 12712068). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12712068

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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