The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2026

Filed:

Sep. 01, 2022
Applicant:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Inventors:

Shinichi Kimoto, Tsukuba, JP;

Shinya Kyogoku, Yokohama, JP;

Ryosuke Iijima, Setagaya, JP;

Shinsuke Harada, Tsukuba, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H10D 30/66 (2025.01); H10D 62/832 (2025.01);
U.S. Cl.
CPC ...
H10D 30/668 (2025.01); H10D 62/8325 (2025.01);
Abstract

A semiconductor device of embodiments includes: a silicon carbide layer having a first face and a second face parallel to a first direction and a second direction perpendicular to the first direction; a first trench, a second trench, and a third trench extending in the first direction; a first region of n-type disposed in the silicon carbide layer; a second region of p-type disposed in the silicon carbide layer, disposed between the first region of n-type and the first face, and disposed between the first trench and the second trench; a sixth region of p-type disposed in the silicon carbide layer and disposed on a bottom surface of the first trench; a seventh region of p-type disposed in the silicon carbide layer and disposed on a bottom surface of the second trench; an eighth region of p-type disposed in the silicon carbide layer and disposed on a bottom surface of the third trench; a ninth region of p-type disposed in the silicon carbide layer and in contact with the sixth region and the second region; and a tenth region of p-type disposed in the silicon carbide layer and in contact with the seventh region and the second region. At a cross section perpendicular to the first direction and including the ninth region and the tenth region, the first region is in contact with a side surface of the first trench on the third trench side and a side surface of the third trench on the first trench side.


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