The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2026

Filed:

Oct. 04, 2022
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Akshay Kumar, San Diego, CA (US);

Arnaud Meylan, San Diego, CA (US);

Ozcan Ozturk, San Diego, CA (US);

Assignee:

QUALCOMM Incorproated, San Diego, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 5/00 (2006.01); H04W 72/0453 (2023.01); H04W 76/15 (2018.01); H04W 80/02 (2009.01);
U.S. Cl.
CPC ...
H04L 5/0094 (2013.01); H04W 72/0453 (2013.01); H04W 76/15 (2018.02); H04W 80/02 (2013.01);
Abstract

Various aspects of the present disclosure generally relate to wireless communication. In some aspects, a wireless communication device may establish a first carrier of a carrier aggregation (CA) configuration, wherein the first carrier is associated with a first configuration. The wireless communication device may establish a second carrier of the CA configuration, wherein the second carrier is associated with a second configuration different than the first configuration. The wireless communication device may receive information indicating a first set of radio link control (RLC) parameters for the first configuration and a second set of RLC parameters for the second configuration. The wireless communication device may perform an RLC function for a first communication on the first carrier using the first set of RLC parameters and for a second communication on the second carrier using the second set of RLC parameters. Numerous other aspects are described.


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