The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2026

Filed:

Feb. 08, 2022
Applicant:

Rafael Advanced Defense Systems Ltd., Haifa, IL;

Inventors:

Avigdor Brillant, Zichron Yaakov, IL;

David Pezo, Netanya, IL;

David Cahana, Haifa, IL;

Rafael Azoulay, Shimshit, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01Q 3/26 (2006.01); H04B 17/12 (2015.01); H04B 17/21 (2015.01);
U.S. Cl.
CPC ...
H01Q 3/267 (2013.01); H04B 17/12 (2015.01); H04B 17/221 (2023.05);
Abstract

Methods and devices provide a test signal to each of a plurality of antenna channels via a test signal line. Each antenna channel includes an amplitude adjustor and a phase adjustor associated with at least one antenna element. For each antenna channel, the test signal provided to the antenna channels is modulated to produce a modulated test signal. The modulated test signal is produced by: i) controlling the amplitude adjustor of the antenna channel to vary a current amplitude of the test signal between a plurality of amplitude states, and ii) controlling the phase adjustor of the antenna channel to vary a current phase of the test signal between a plurality of phase states. A received test signal received from the antenna channels is processed to determine amplitude and phase errors associated with the modulated test signals associated with the antenna channels.


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