The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2026

Filed:

Aug. 26, 2021
Applicant:

Micromass Uk Limited, Wilmslow, GB;

Inventors:

David Gordon, Middlewich, GB;

Nicola Lumley, Wilmslow, GB;

Alastair Booth, Glossop, GB;

Richard Moulds, Stockport, GB;

Assignee:

Micromass UK Limited, Wilmslow, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/06 (2006.01); H01J 49/00 (2006.01);
U.S. Cl.
CPC ...
H01J 49/06 (2013.01); H01J 49/0036 (2013.01);
Abstract

A mass spectrometer is disclosed comprising: an ion detector; ion optics for guiding ions to the ion detector; one or more voltage supply for supplying voltages to said ion optics; control circuitry for controlling the one or more voltage supply so as to switch the ion optics between operating in a first mode in which the ion optics are unable to transmit ions having a first mass to charge ratio or first polarity to the ion detector and a second mode in which the ion optics are able to transmit ions having said first mass to charge ratio or first polarity to the ion detector for a time period; and to repeatedly switch between the first and second modes a plurality of times; and a processor and circuitry configured to: (i) determine the intensity of an ion signal detected by the detector at a first time in each of the time periods that the ion optics are in the second mode; and (ii) determine the intensity of the ion signal detected by the detector at a second, later time in each of the time periods that the ion optics are in the second mode.


Find Patent Forward Citations

Gordon, David. (2026). System for determining the cleanliness of mass spectrometer ion optics (U.S. Patent No. 12706290). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12706290

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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