The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2026

Filed:

Sep. 10, 2024
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Eunji Kim, Suwon-si, KR;

Wandong Kim, Suwon-si, KR;

Byongmo Moon, Suwon-si, KR;

Kwangjin Lee, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 29/10 (2006.01);
U.S. Cl.
CPC ...
G11C 29/10 (2013.01);
Abstract

A memory device includes a memory cell array region including a plurality of memory cells, a first test pattern form disposed below a bonding pad and configured to output a first test output signal, a second test pattern form disposed below a non-bonding pad and configured to output a second test output signal, and a damage detection circuit. The damage detection circuit is configured to output a test result signal indicating whether a lower region of the bonding pad has been damaged. The test result signal is based on the number of times a logic level of the first test output signal transitions and the number of times a logic level of the second test output signal transitions.


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