The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2026

Filed:

Jul. 13, 2023
Applicant:

Keyence Corporation, Osaka, JP;

Inventors:

Shingo Matsumura, Osaka, JP;

Suguru Sekiya, Osaka, JP;

Kenta To, Osaka, JP;

Assignee:

KEYENCE CORPORATION, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 20/69 (2022.01); G06T 7/00 (2017.01); G06V 10/141 (2022.01);
U.S. Cl.
CPC ...
G06V 20/693 (2022.01); G06T 7/0014 (2013.01); G06V 10/141 (2022.01); G06T 2207/30242 (2013.01);
Abstract

Counting accuracy of colonies is improved. A colony counting device captures a test individual to generate an image of the test individual, registers the image of the test individual in an initial state as a reference image, identifies a residue included in the reference image and identifies a position of the residue in a test image corresponding to the residue included in the reference image based on a displacement of each of two or more common characteristic portions between the reference image and the test image that is an image of the test individual after culturing, and counts the number of colonies while excluding the residue from a count as a colony based on the position of the residue.


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